(PI: Auburn, MA) -- PI, a global leader in nanopositioning instrumentation, has extended its PIFOC series of microscopy products, adding two new economical nano-focus scanner packages for applications including surface metrology, super-resolution microscopy, light-sheet microscopy, and digital-slide scanning.
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Two scanning ranges are currently available: P-725.1CDE1S offers 100 µm, and the P-725.4CDE1S offers 400 µm. The fast scanners are based on a closed-loop piezo flexure design with capacitive position feedback for high linearity, stability, and repeatability. This includes a compact digital controller with software.
Features
• Travel range: 100 μm or 400 μm
• Settling time: ≤ 19 ms or ≤ 35 ms
• Point repeatability, 10% step, 1 sigma: ≤ 20 nm
• Large clear aperture with Ø 29 mm
• Outstanding lifetime thanks to PICMA piezo actuators
• Nanometer resolution due to capacitive sensors
• High guide accuracy due to zero-play flexure guides
• Controller included
These scanners are suited for surface metrology, semiconductor inspection, genome sequencing, 3D imaging, digital-slide scanning, super-resolution microscopy, light-sheet microscopy, fluorescence microscopy, interferometry, autofocus systems, and more.
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